|  |
| |
| Artikel-Nr.:
858A-9783319547138 Herst.-Nr.:
9783319547138 EAN/GTIN:
9783319547138 |
| |
|
| | |
| Testing of Interposer-Based 2.5D Integrated Circuits Weitere Informationen: | | Author: | Ran Wang; Krishnendu Chakrabarty | Verlag: | Springer International Publishing | Sprache: | eng |
|
| | |
| | | |
| Weitere Suchbegriffe: allgemeine technikbücher - englischsprachig, Prozesstechnik, PhysicalDesignfor3DIntegratedCircuits; 2.5DICTesting; TestingoftheSiliconInterposer; TestingInterposerInterconnects; BISTarchitecturesforinterconnectanddietesting, Physical Design for 3D Integrated Circuits, 2.5D IC Testing, Testing of the Silicon Interposer, Testing Interposer Interconnects, BIST architectures for interconnect and die testing |
| | |
| |